HORIBA JOBIN YVON SAS

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1464
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 8197
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 7199
 
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 4124
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
 
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241
 
 
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]117

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9736389 Device and method for characterizing a sample using localized measurementsJul 25, 13Aug 15, 17[H04N, G01Q, G02B]
9709441 Spectrometer of high diffraction efficiency for analyzing the spectrum of a light beamNov 29, 13Jul 18, 17[G01J]
9638635 Spectrometer for analysing the spectrum of a light beamNov 29, 13May 02, 17[G01J, G01N, G02B]
9551618 Wavefront-division polarimetric analysis method and device, spectropolarimeter, polarimetric camera and optical microscope using such a deviceJul 25, 13Jan 24, 17[G01J]
9508539 Glow discharge mass spectrometry method and deviceJun 17, 14Nov 29, 16[H01J]
9068889 Device and method for observing and for measuring raman scatteringDec 20, 11Jun 30, 15[G01J, G01N]
9036145 Conoscopic illumination optical device with a hollow cone for an optical microscope and method of optical microscopy in conoscopyJul 20, 12May 19, 15[G01J, G01N, G02B]
8970954 Polarization converter of bidirectional cylindrical symmetry and cartesian-cylindrical polarization conversion methodJul 18, 11Mar 03, 15[G02B]
8934171 Planar optical system for wide field-of-view polychromatic imagingJul 29, 10Jan 13, 15[F21V, G02B]
8908180 Device and method for polarimetric measurement with microscopic resolution, polarimetry accessory for a microscope, ellipsomicroscope and ellipsometric contrast microscopeJul 18, 11Dec 09, 14[G01J, G02B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0166,396 PROCESS AND SYSTEM FOR ADOPTION OF A MATERIAL OBJECT OFFERED ON AN INFORMATION NETWORKAbandonedDec 23, 11Jun 27, 13[G06Q]
7616309 Device for the positioning of optical elements with retractable stopExpiredMar 10, 06Nov 10, 09[G01J, G02B]
7362430 Raman spectrometry apparatusExpiredJun 26, 03Apr 22, 08[G01J]
7277170 Device and method for spectroscopic measurement with an imaging device comprising a matrix of photodetectorsExpiredSep 02, 04Oct 02, 07[G01J]
7265824 Method and device for obtaining a low-noise optical signalExpiredJan 13, 04Sep 04, 07[G01J]
7227635 Device and method for positioning a sample mounted on a glow discharge spectrometerExpiredJun 17, 02Jun 05, 07[G01J]
7184145 Achromatic spectroscopic ellipsometer with high spatial resolutionExpiredJun 16, 03Feb 27, 07[G01J]
2005/0270,647 Two-dimensional diffraction grating with alternate multilayered stacks and its process of manufacture, and spectroscopic devices including these gratingsAbandonedDec 23, 04Dec 08, 05[G02B]

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